Mechanical measurements at the micron and nanometer scales

Mechanics of Materials

Volumn 35, Issue 3-6, 2003, Pages 217-231

  Knauss, Wolfgang G ^a   Chasiotis, Ioannis ^b   Huang, Ying ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b University of Virginia   (United States)

Author keywords

Digital image correlation; Elliptical notches; Failure strength; MEMS perforated specimens; Probe microscopy; Size effects

Indexed keywords

GRAIN SIZE AND SHAPE; IMAGE PROCESSING; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY; POLYCRYSTALLINE MATERIALS;

DIGITAL IMAGE CORRELATION;

MATERIALS SCIENCE;

EID: 0037340866     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-6636(02)00271-5     Document Type: Conference Paper

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