Submicron deformation field measurements: Part 2. Improved digital image correlation

Experimental Mechanics

Volumn 38, Issue 2, 1998, Pages 86-92

  Vend Roux, G ^a   Knauss, W G ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; IMAGE PROCESSING; SCANNING TUNNELING MICROSCOPY; STRAIN;

DIGITAL IMAGE CORRELATION; SUBMICRON DEFORMATION FIELD MEASUREMENTS; SURFACE TOPOGRAPHY;

DEFORMATION;

EID: 0032095839     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02321649     Document Type: Article

References (12)

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