Overerase phenomena: An insight into flash memory reliability

Proceedings of the IEEE

Volumn 91, Issue 4, 2003, Pages 617-625

  Chimenton, Andrea ^a,b   Pellati, Paolo ^b   Olivo, Piero ^b  

^a IEEE   (Iran)

^b UNIVERSITY OF FERRARA   (Italy)

Author keywords

Erasing operations; Flash memories; Integrated circuit reliability; Reliability; Semiconductor memories

Indexed keywords

COMPUTER PROGRAMMING; DATA STORAGE EQUIPMENT; LOGIC DESIGN; MOS DEVICES; PROM; RELIABILITY; SEMICONDUCTOR STORAGE;

CIRCUITRY FAILURE; ERASING OPERATIONS; INTEGRATED CIRCUIT RELIABILITY; SEMICONDUCTOR MEMORIES; SINGLE BIT FAILURES;

FLASH MEMORY;

EID: 13244251813     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2003.811713     Document Type: Review

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