Flash memory quality and reliability issues

Records of the IEEE International Workshop on Memory Technology, Design and Testing

Volumn , Issue , 1996, Pages 32-36

  Verma, Rajiv ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY;

DUAL LAYER; MEMORY RELIABILITY; MEMORY TECHNOLOGY; NOR FLASH; POLYSILICON GATES; SMALL GEOMETRY;

FLASH MEMORY;

EID: 18844455199     PISSN: 10874852     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTDT.1996.782488     Document Type: Conference Paper

References (2)

1. Intel Corporation, "Flash Memory Databook", Chapter 9, 1995.
2. Brian Dipert, "Designing with Flash Memory", pp 40-49, 1993.