Automated test equipment for research on nonvolatile memories

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 5, 2001, Pages 1162-1166

  Pellati, P ^a   Olivo, P ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Automated test equipment; Data acquisition; Integrated circuit measurements; Integrated circuit reliability; Non volatile memories

Indexed keywords

FLASH MEMORY; INTEGRATED CIRCUIT TESTING; NONVOLATILE STORAGE; RELIABILITY;

AUTOMATED TEST EQUIPMENT; INTEGRATED CIRCUIT MEASUREMENT; INTEGRATED CIRCUIT RELIABILITY;

AUTOMATIC TESTING;

EID: 0035483517     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.963177     Document Type: Article

References (10)

1. Measurement system for a preliminary characterization of flash memory cells for multilevel applications
2. PCI local bus specification
3. Flash memory cells: An overview
4. Reliability issues of flash memory cells
5. Flash memory reliability
6. Memory architecture and related issues
7. Nonvolatile multilevel memories for digital applications
8. 70-Msps arbitrary waveform generator with standard μ processor interface
9. Erratic erase in ETOX™ flash memory array
10. Analysis of erratic bits in flash memories