A reassessment of the molar volume of silicon and of the Avogadro constant

IEEE Transactions on Instrumentation and Measurement

Volumn 50, Issue 2, 2001, Pages 593-597

  De Bièvre, Paul ^a   Valkiers, Staf ^a   Kessel, Rüdiger ^a   Taylor, Philip D P ^a   Becker, Peter ^b   Bettin, H ^b   Peuto, Anna ^c   Pettorruso, Savino ^c   Fujii, K ^d   Waseda, A ^d   Tanaka, M ^d   Deslattes, R D ^e   Peiser, H S ^e   Kenny, M J ^f  

^a JOINT RESEARCH CENTRE   (Italy)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c Istituto di Metrologia Gustavo Colonnetti   (Italy)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^f CSIRO   (Australia)

Author keywords

Avogadro constant; Density; Molar mass; Molar volume; Single (single crystal)

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; DENSITY MEASUREMENT (SPECIFIC GRAVITY); INTERFEROMETRY; LATTICE CONSTANTS; SINGLE CRYSTALS; VOLUME MEASUREMENT;

AVOGADRO CONSTANT; MOLAR MASS; MOLAR VOLUME; RELATIVE STANDARD UNCERTAINTY;

SILICON;

EID: 0035308799     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.918199     Document Type: Article

References (28)