The determination of the avogadro constant - Not simply a metrological problem

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 2, 1999, Pages 225-229

  Becker, P ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Avogadro constant; Self point defects; Silicon

Indexed keywords

EID: 0000622776     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769569     Document Type: Article

References (14)

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