Origin and implications of the observed rhombohedral phase in nominally tetragonal Pb(Zr0.35Ti0.65)O3 thin films

Journal of Applied Physics

Volumn 94, Issue 8, 2003, Pages 5210-5219

  Kelman, Maxim B ^a   McIntyre, Paul C ^a   Gruverman, Alexei ^b   Hendrix, Bryan C ^c   Bilodeau, Steven M ^c   Roeder, Jeffrey F ^c  

^a Stanford University   (United States)

^b North Carolina State University   (United States)

^c ENTEGRIS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITORS; ELECTRODES; FILM GROWTH; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; THERMAL EFFECTS;

PIEZORESPONSE MICROSCOPY;

THIN FILMS;

EID: 0242272359     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1610773     Document Type: Article

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