Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zrx,Ti1-x)O3 thin films as a function of composition

Journal of Materials Research

Volumn 14, Issue 11, 1999, Pages 4307-4318

  Hiboux, S ^a   Muralt, P ^a   Maeder, T ^a  

^a Federal Institute of Technology   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL LATTICES; FERROELECTRICITY; LEAD COMPOUNDS; PIEZOELECTRICITY; SPUTTER DEPOSITION; THIN FILMS; X RAY CRYSTALLOGRAPHY;

MORPHOTROPIC PHASE BOUNDARY;

DIELECTRIC FILMS;

EID: 0033221544     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0584     Document Type: Article

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