Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 1477-1481

  Ganpule, C S ^a   Nagarajan, V ^a   Hill, B K ^a   Roytburd, A L ^a   Williams, E D ^a   Ramesh, R ^a   Alpay, S P ^b   Roelofs, A ^c   Waser, R ^c   Eng, L M ^d  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF CONNECTICUT   (United States)

^c RWTH AACHEN UNIVERSITY   (Germany)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); DIFFERENTIAL SIGNAL; DOMAIN STRUCTURE; IN-PLANE POLARIZATION; OUT-OF-PLANE; PIEZORESPONSE; POLARIZATION VECTORS; POLYDOMAIN; RELATIVE ORIENTATION; SRTIO;

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; POLARIZATION; SCANNING TUNNELING MICROSCOPY;

FERROELECTRIC THIN FILMS;

EID: 0036470284     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1421219     Document Type: Article

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