Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films

Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1405-1415

  Foster, C M ^a   Pompe, W ^b,c   Daykin, A C ^b,d   Speck, J S ^b,d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b University of California   (United States)

^c MAX PLANCK INSTITUTE   (Germany)

^d UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000086771     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360978     Document Type: Article

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