Structural analysis of coexisting tetragonal and rhombohedral phases in polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

Journal of Materials Research

Volumn 18, Issue 1, 2003, Pages 173-179

  Kelman, Maxim B ^a   McIntyre, Paul C ^a   Hendrix, Bryan C ^b   Bilodeau, Steven M ^b   Roeder, Jeffrey F ^b   Brennan, Sean ^c  

^a Stanford University   (United States)

^b ENTEGRIS INC   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BRAGG SCATTERING;

THIN FILMS;

EID: 0038007340     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0024     Document Type: Article

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