In situ study of the evolution of domain structure in free-standing polycrystalline thin films under external stress

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 6, 1997, Pages 3485-3489

  Ren, S ^a   Lu, C ^a   Shen, H ^a   Wang, Y ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000792687     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.3485     Document Type: Article

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