Why small avalanche photodiodes are beautiful

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4999, Issue , 2003, Pages 349-362

  Rees, G J ^a   David, J P R ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

APD; Avalanche multiplication; Dead space; Impact ionisation; Noise; Nonlocal; Speed

Indexed keywords

CHARGE CARRIERS; IMPACT IONIZATION; PROBABILITY; SEMICONDUCTOR LASERS; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE;

AVALANCHE PHOTODIODES;

PHOTODIODES;

EID: 0141678234     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.482482     Document Type: Conference Paper

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