Avalanche noise measurement in thin Si p+-i-n+ diodes

Applied Physics Letters

Volumn 76, Issue 26, 2000, Pages 3926-3928

  Tan, C H ^a   Clark, J C ^a   David, J P R ^a   Rees, G J ^a   Plimmer, S A ^a   Tozer, R C ^a   Herbert, D C ^b   Robbins, D J ^b   Leong, W Y ^b   Newey, J ^b  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000571955     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126823     Document Type: Article

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