A new approach for computing the bandwidth statistics of avalanche photodiodes

IEEE Transactions on Electron Devices

Volumn 47, Issue 6, 2000, Pages 1273-1279

  Hayat, Majeed M ^a   Dong, Guoquan ^a  

^a University of Dayton   (United States)

Author keywords

Avalanche buildup time; Avalanche photodiode; Bandwidth; Dead space; Impact ionization; Impulse response; Recurrence equations; Time response

Indexed keywords

CHARGE CARRIERS; FREQUENCY RESPONSE; IMPACT IONIZATION; INTEGRAL EQUATIONS; PHOTODIODES; PROBABILITY DENSITY FUNCTION; RANDOM PROCESSES;

AVALANCHE PHOTODIODES; BANDWIDTH STATISTICS; DEAD SPACE; TIME RESPONSE;

AVALANCHE DIODES;

EID: 0033732296     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.842973     Document Type: Article

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