Fokker-Planck model for nonlocal impact ionization in semiconductors

Journal of Applied Physics

Volumn 90, Issue 3, 2001, Pages 1314-1317

  Jacob, Biju ^a   Robson, P N ^a   David, J P R ^a   Rees, G J ^a  

^a Tosoh SMD Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035424234     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1384854     Document Type: Article

References (11)

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