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Volumn 45, Issue 10, 1998, Pages 2102-2107

Avalanche multiplication noise characteristics in thin GaAs p+-i-n+ diodes

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING GALLIUM ARSENIDE; SPURIOUS SIGNAL NOISE;

EID: 0032188252     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.725242     Document Type: Article
Times cited : (131)

References (16)
  • 5
    • 0022152203 scopus 로고    scopus 로고
    • The determination of impact ionization coefficients in (100) gallium arsenide using avalanche noise and photocurrent multiplication measurements
    • G. E. Bulman V. M. Robbins and G. E. Stillman The determination of impact ionization coefficients in (100) gallium arsenide using avalanche noise and photocurrent multiplication measurements IEEE Trans. Electron. Devices vol. ED-32 pp. 2454-2466 1985.
    • IEEE Trans. Electron. Devices Vol. ED-32 Pp. 2454-2466 1985.
    • Bulman, G.E.1    Robbins, V.M.2    Stillman, G.E.3
  • 8
    • 0026866665 scopus 로고    scopus 로고
    • Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect
    • J. S. Marsland R. C. Woods and C. A. Brownhill Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect J. Appl. Phys vol. 67 pp. 1129-1135 1992.
    • J. Appl. Phys Vol. 67 Pp. 1129-1135 1992.
    • Marsland, J.S.1    Woods, R.C.2    Brownhill, C.A.3
  • 14
    • 0005533732 scopus 로고    scopus 로고
    • On the effect of ionization dead spaces on avalanche multiplication noise for uniform electric fields
    • J. S. Marsland On the effect of ionization dead spaces on avalanche multiplication noise for uniform electric fields J. Appl. Phys. vol. 67 pp. 1929-1933 1990.
    • J. Appl. Phys. Vol. 67 Pp. 1929-1933 1990.
    • Marsland, J.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.