Accumulator based deterministic BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 412-421

  Dorsch, Rainer ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DETERMINISTIC TESTING; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; MICROPROCESSOR CHIPS; ROM;

BUILT-IN SELF TEST;

EID: 0032306242     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1998.743181     Document Type: Conference Paper

References (32)