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Volumn , Issue , 1998, Pages 412-421
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Accumulator based deterministic BIST
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DETERMINISTIC TESTING;
TEST PATTERN GENERATION;
INTEGRATED CIRCUIT TESTING;
LOGIC CIRCUITS;
MICROPROCESSOR CHIPS;
ROM;
BUILT-IN SELF TEST;
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EID: 0032306242
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TEST.1998.743181 Document Type: Conference Paper |
Times cited : (57)
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References (32)
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