Models for quantitative charge imaging by atomic force microscopy

Journal of Applied Physics

Volumn 90, Issue 6, 2001, Pages 2764-2772

  Boer, Elizabeth A ^a,b   Bell, L D ^a   Brongersma, Mark L ^a   Atwater, Harry A ^a   Watson, Thomas J ^a  

^a California Institute of Technology   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035883879     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1394896     Document Type: Article

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