Virtual charge method for electrostatic calculations in metallic tip and semiconducting sample systems

Journal of Applied Physics

Volumn 82, Issue 11, 1997, Pages 5589-5596

  De La Broise X ^a   Lannoo, M ^a   Delerue, C ^a  

^a Institut Superieur de l'Electronique et du Numerique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038962888     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366419     Document Type: Article

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