Charging of single Si nanocrystals by atomic force microscopy

Applied Physics Letters

Volumn 78, Issue 20, 2001, Pages 3133-3135

  Boer, E A ^a   Bell, L D ^a,c   Brongersma, M L ^a   Atwater, H A ^a   Ostraat, M L ^b   Flagan, R C ^b  

^a California Institute of Technology   (United States)

^b California Institute of Technology   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035858336     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1371783     Document Type: Article

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