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Volumn 66, Issue SUPPL. 1, 1998, Pages

Nonlinear tip-sample interactions affecting frequency responses of microcantilevers in tapping mode atomic forcemicroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; COMPLIANT MATERIALS; CONTACT FORCES; EQUILIBRIUM POSITIONS; EQUILIBRIUM SEPARATION; FREE OSCILLATION; FREQUENCY SHIFT; FRESHLY CLEAVED MICA; INTERMITTENT-CONTACTS; LARGE SHIFTS; MICRO-CANTILEVERS; OPERATION MODE; RESONANT FREQUENCIES; TAPPING MODES; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TIP-SAMPLE INTERACTION; VIBRATION AMPLITUDE;

EID: 33646614952     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051270     Document Type: Article
Times cited : (5)

References (16)
  • 14
    • 73149088577 scopus 로고    scopus 로고
    • Tetra Tip Cantilever, from Olympus Optical Co. Ltd.
    • Tetra Tip Cantilever, from Olympus Optical Co. Ltd.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.