Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopy

Applied Physics Letters

Volumn 75, Issue 9, 1999, Pages 1326-1328

  Jones, J T ^a   Bridger, P M ^a   Marsh, O J ^a   McGill, T C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001371717     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124682     Document Type: Article

References (10)

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