In-situ monitoring of surface chemistry and charge transfer at semiconductor surfaces

Applied Surface Science

Volumn 104-105, Issue , 1996, Pages 61-67

  Fefer, E ^a   Kronik, L ^a   Leibovitch, M ^a   Shapira, Yoram ^a   Riedl, W ^b  

^a TEL AVIV UNIVERSITY   (Israel)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; PHOTOVOLTAIC EFFECTS; POLYCRYSTALS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; SINGLE CRYSTALS; SURFACE PHENOMENA;

WORK FUNCTIONS;

SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 4243049931     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00121-3     Document Type: Article

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