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International Reviews in Physical Chemistry

Volumn 19, Issue 2, 2000, Pages 247-276

Surface photovoltage imaging for the study of local electronic structure at semiconductor surfaces

(1) Haase, G a

a WEIZMANN INSTITUTE OF SCIENCE (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT; ELECTRIC FIELD; ELECTRIC POTENTIAL; IMAGING SYSTEM; REVIEW; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SURFACE CHARGE; SURFACE PROPERTY;

EID: 0033660167 PISSN: 0144235X EISSN: None Source Type: Journal
DOI: 10.1080/01442350050020897 Document Type: Review

Times cited : (17)

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