Surface photovoltage spectroscopy, photoreflectance, and reflectivity characterization of an InGaAs/GaAs/GaAlAs vertical-cavity surface-emitting laser including temperature dependence

Applied Physics Letters

Volumn 77, Issue 1, 2000, Pages 37-39

  Huang, Y S ^a,c   Malikova, L ^a   Pollak, Fred H ^a,d   Shen, H ^b   Pamulapati, J ^b   Newman, P ^b  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

^c NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^d CITY UNIVERSITY OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002514299     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126869     Document Type: Article

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