Quality control and characterization of Cu(In,Ga)Se2-based thin-film solar cells by surface photovoltage spectroscopy

Solar Energy Materials and Solar Cells

Volumn 51, Issue 1, 1998, Pages 21-34

  Kronik, L ^a   Mishori, B ^a   Fefer, E ^a   Shapira, Y ^a   Riedl, W ^b  

^a TEL AVIV UNIVERSITY   (Israel)

^b SIEMENS AG   (Germany)

Author keywords

Cu(in,ga)se2; Quality control; Surface photovoltage

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; ENERGY GAP; QUALITY CONTROL; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPIC ANALYSIS; THIN FILM DEVICES; ZINC OXIDE;

CADMIUM SULFIDE; SURFACE PHOTOVOLTAGE SPECTROSCOPY;

SOLAR CELLS;

EID: 0032000110     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0927-0248(97)00205-5     Document Type: Article

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