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Surface and Interface Analysis

Volumn 31, Issue 10, 2001, Pages 966-986

Optical second harmonic spectroscopy of semiconductor surfaces: Advances in microscopic understanding

(3) Downer, M C a Mendoza, B S b Gavrilenko, V I c

a UNIVERSITY OF TEXAS AT AUSTIN (United States)

b CENTRO DE INVESTIGACIONES EN ÓPTICA (Mexico)

c RUDOLPH TECHNOLOGIES INC (United States)

Author keywords

Second harmonic spectroscopy; Silicon surfaces

Indexed keywords

BANDWIDTH; ELECTRON RESONANCE; EPITAXIAL GROWTH; INTERFACES (MATERIALS); SECOND HARMONIC GENERATION; SPECTROSCOPIC ANALYSIS;

OPTICAL SPECTROSCOPY;

SURFACE STRUCTURE;

EID: 0035474279 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1133 Document Type: Article

Times cited : (80)

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