Reflectance difference spectroscopy: Experiment and theory for the model system si(001):As and application to Si(001)

Physical Review Letters

Volumn 76, Issue 15, 1996, Pages 2810-2813

  Kipp, Lutz ^a   Biegelsen, D K ^b   Northrup, J E ^b   Swartz, L E ^b   Bringans, R D ^b  

^a UNIVERSITY OF KIEL   (Germany)

^b PALO ALTO RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001064095     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.2810     Document Type: Article

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