Silicon interband transitions observed at interfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 4, 1998, Pages R1734-R1737

  Erley, G ^a   Daum, W ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000184992     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.R1734     Document Type: Article

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