Scanning tunneling microscopy study of Si growth on a Si(111×-B surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 19, 1996, Pages 12902-12906

  Zotov, A ^a   Kulakov, M ^b   Bullemer, B ^b   Eisele, I ^b  

^a INSTITUTE OF AUTOMATION AND CONTROL PROCESSES   (Russian Federation)

^b BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000315165     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.12902     Document Type: Article

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