Mapping piezoelectric-field distribution in gallium nitride with scanning second-harmonic generation microscopy

Scanning

Volumn 23, Issue 3, 2001, Pages 182-192

  Sun, Chi Kuang ^a   Chu, Shih Wei ^a   Tai, Shi Peng ^a   Keller, Stacia ^b   Abare, A ^b   Mishra, U K ^b   Denbaars, Steven P ^b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b University of California   (United States)

Author keywords

Electric field; Gallium nitride; Second harmonic generation; Third harmonic generation; Three photon luminescence

Indexed keywords

ELECTRIC FIELDS; FLUORESCENCE; GALLIUM NITRIDE; MICROSCOPIC EXAMINATION; MULTIPHOTON PROCESSES; PHOTOLUMINESCENCE; SECOND HARMONIC GENERATION;

DEFECT DENSITY;

SCANNING;

GALLIUM NITRATE; INDIUM;

ARTICLE; ELECTRIC FIELD; IMAGE ANALYSIS; IMAGE QUALITY; LUMINESCENCE; PIEZOELECTRICITY; PRIORITY JOURNAL; RESIDUE ANALYSIS; SAMPLING; SCANNING ELECTRON MICROSCOPY;

EID: 0034994781     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950230304     Document Type: Article

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