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Volumn 77, Issue 13, 1996, Pages 2758-2761
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Photoemission extended fine structure study of the SiO2/Si(111) interface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000258412
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.77.2758 Document Type: Article |
Times cited : (61)
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References (19)
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