Photoemission extended fine structure study of the SiO2/Si(111) interface

Physical Review Letters

Volumn 77, Issue 13, 1996, Pages 2758-2761

  Sieger, M T ^a   Luh, D A ^a   Miller, T ^a   Chiang, T C ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000258412     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.2758     Document Type: Article

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