메뉴 건너뛰기




Volumn 77, Issue 13, 1996, Pages 2758-2761

Photoemission extended fine structure study of the SiO2/Si(111) interface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000258412     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.2758     Document Type: Article
Times cited : (61)

References (19)
  • 3
    • 4244157531 scopus 로고
    • An ordered component was observed, but with a concentration less than 1%. PRLTAO
    • A. Munkholm, S. Brennan, F. Comin and L. Ortega: Phys. Rev. Lett. 75, 4254 (1995). An ordered component was observed, but with a concentration less than 1%. PRLTAO
    • (1995) Phys. Rev. Lett , vol.75 , pp. 4254
    • Munkholm, A.1    Brennan, S.2    Comin, F.3    Ortega, L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.