Optical second-harmonic electroreflectance spectroscopy of a Si(001) metal-oxide-semiconductor structure

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 12, 1996, Pages R7607-R7609

  Dadap, J ^a   Hu, X ^a   Anderson, M ^a   Downer, M ^a   Lowell, J ^b  

^a The University of Texas at Austin   (United States)

^b ADVANCED MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001127261     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.R7607     Document Type: Article

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