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Y. Royter, T. Minotani, H. Ishii, A. Hirata, S. Yagi, K. Machida, T. Furuta, T. Ishibashi, A. Sasaki, and T. Nagatsuma, "Ultrahigh-speed 1.55-μmphotodiodes on Si with low-loss millimeter-wavewaveguides," in IEEE LEOS Tech. Dig., 2000, pp. 283-284.
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T. Minotani, Y. Royter, H. Ishii, A. Hirata, K. Machida, A. Sasaki, and T. Nagatsuma, "Three-dimensional millimeter-wave photonic integrated circuits on Si," in IEEE MTT-S Int. Microwave Symp. Dig., 2001, pp. 57-60.
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Integrated packaging of over 100 GHz bandwidth uni-traveling- carrier photodiodes
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51
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55
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0030412069
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Novel optical probing system with submicron spatial resolution for internal diagnosis of VLSI circuits
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K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, and J. Matsumoto, "Novel optical probing system with submicron spatial resolution for internal diagnosis of VLSI circuits," in Proc. Int. Test Conf., 1996, pp. 269-275.
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56
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Observation of the internal waveforms in high-speed high-density LSI's using an EOS prober
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C. Hashimoto, T. Takizawa, S. Nakajima, M. Shinagawa, and T. Nagatsuma, "Observation of the internal waveforms in high-speed high-density LSI's using an EOS prober," Microelectron. Reliab., to be published.
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57
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0030191711
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Analysis of microwave propagation effects using 2-D electro-optic field mapping techniques
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G. David, R. Tempel, I. Wolff, and D. Jäger, "Analysis of microwave propagation effects using 2-D electro-optic field mapping techniques," Opt. Quantum Electron., vol. 28, pp. 919-931, 1996.
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Wide-band high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal response of high-speed electronic devices
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T. Otsuji, K. Kato, S. Kimura, and T. Nagatsuma, "Wide-band high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal response of high-speed electronic devices," IEEE Trans. Microwave Theory Tech., vol. 47, pp. 525-533, May 1999.
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M. Shinagawa and T. Nagatsuma, "A novel high-impedance probe for multi-gigahertz signal measurement," IEEE Trans. Instrum. Meas., vol. 45, pp. 575-579, Apr. 1996.
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Y. Imaizumi, M. Shinagawa, and H. Ogawa, "Electric field distribution measurement of microstrip antennas and arrays using electro-optic sampling," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 2402-2047, Sept. 1995.
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A. Stöhr, R. Heinzekmann, T. Alder, D. Kalinowsli, M. Gross, and D. Jäger, "Integrated optical E-field sensors using TW EA-modulators," in Int. TopicalWorkshop Contemporary Photon. Technol. Tech. Dig., 1998, pp. 227-228.
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66
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0034204673
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Optimized CdTe sensors for measurement of electric and magnetic fields in the near-field region
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Packaged photonic probes for an on-wafer broad-band millimeter-wave network analyzer
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N. Sahri and T. Nagatsuma, "Packaged photonic probes for an on-wafer broad-band millimeter-wave network analyzer," Photon. Technol. Lett., vol. 12, pp. 1225-1227, Sept. 2000.
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Photon. Technol. Lett.
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68
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New dimensions in T-ray imaging
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S. Hunsche, D. M. Mittleman, M. Koch, and M. C. Nuss, "New dimensions in T-ray imaging," IEICE Trans. Electron., vol. E81-C, pp. 269-275, 1998.
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69
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Recent development of free-space THz imaging
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Q. Chen, P. Y. Han, Z. Jiang, and X.-C. Zhang, "Recent development of free-space THz imaging," in Proc. IEEE Int. Terahertz Electron. Conf., 1999, pp. 73-76.
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70
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Millimeter-wave imaging using an electrooptic detector as a harmonic mixer
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Sept.-Oct.
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A. Sasaki and T. Nagatsuma, "Millimeter-wave imaging using an electrooptic detector as a harmonic mixer," IEEE J. Select. Topics Quantum Electron., vol. 6, pp. 735-740, Sept.-Oct. 2000.
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IEEE J. Select. Topics Quantum Electron.
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