Packaged photonic probes for an on-wafer broad-band millimeter-wave network analyzer

IEEE Photonics Technology Letters

Volumn 12, Issue 9, 2000, Pages 1225-1227

  Sahri, Nabil ^a,b   Nagatsuma, Tadao ^a  

^a NTT CORPORATION   (Japan)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; ELECTRONICS PACKAGING; ELECTROOPTICAL EFFECTS; LIGHT SCATTERING; MICROOPTICS; OPTICAL WAVEGUIDES; PHOTODIODES; PROBES; SILICON WAFERS;

ACTIVE PHOTONIC PROBES; ELECTROOPTIC SAMPLING (EOS) TECHNIQUES; ON-WAFER BROADBAND MILLIMETER WAVE NETWORK ANALYZERS; UNI-TRAVELING-CARRIER PHOTODIODES (UTC-PD);

INTEGRATED OPTOELECTRONICS;

EID: 0034264854     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.874243     Document Type: Article

References (9)

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