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Volumn 28, Issue 7, 1996, Pages 919-932

Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WIRING; ELECTROMAGNETIC FIELD THEORY; ELECTROOPTICAL EFFECTS; FREQUENCIES; MATHEMATICAL TECHNIQUES; MICROWAVES; MILLIMETER WAVES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0030191711     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00820157     Document Type: Article
Times cited : (18)

References (25)
  • 1
    • 0037937652 scopus 로고
    • edited by R. B. Marcus Academic Press, New York
    • H. SCHUMACHER and E. W. STRID, in Semiconductors and Semimetals, Vol. 28, edited by R. B. Marcus (Academic Press, New York, 1990) pp. 41-83.
    • (1990) Semiconductors and Semimetals , vol.28 , pp. 41-83
    • Schumacher, H.1    Strid, E.W.2
  • 24
    • 26444466976 scopus 로고
    • PhD thesis, Stanford University, CA
    • J. L. FREEMAN, PhD thesis, Stanford University, CA, 1990.
    • (1990)
    • Freeman, J.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.