Electrooptic mapping of near-field distributions in integrated microwave circuits

IEEE Transactions on Microwave Theory and Techniques

Volumn 46, Issue 12 PART 2, 1998, Pages 2338-2343

  Yang, Kyoung ^a,b   David, Gerhard ^a,b   Robertson, Stephen V ^a,b   Whitaker, John F ^a,b   Katehi, Linda P B ^a,b  

^a University of Michigan   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

Electric field measurement; Electrooptic measurements; Integrated circuit testing; Microwave measurements; Nondestructive testing

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC FIELD MEASUREMENT; ELECTRIC NETWORK ANALYSIS; ELECTROOPTICAL EFFECTS; INTEGRATED CIRCUIT TESTING; MICROWAVE MEASUREMENT; NONDESTRUCTIVE EXAMINATION;

ELECTROOPTIC MAPPING;

MICROWAVE INTEGRATED CIRCUITS;

EID: 0032296239     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.739221     Document Type: Article

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