Optoelectronic on-chip characterization of ultrafast electric devices: Measurement techniques and applications

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 2, Issue 3, 1996, Pages 586-603

  Pfeifer, Torsten ^a,b,c   Heiliger, Hanns Michael ^a,b,d   Löffler, Torsten ^a   Ohlhoff, Carsten ^a   Meyer, Christoph ^a   Lüpke, Gunter ^a   Roskos, Hartmut G ^a   Kurz, Heinrich ^a  

^a UNIVERSITY HOSPITAL RWTH AACHEN   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c Applied Micro and Optoelectronic GmbH   (Germany)

^d UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; OPTICAL TESTING; OPTICAL VARIABLES MEASUREMENT; PROBES;

ONCHIP ELECTRIC PULSE GENERATION; OPTOELECTRONIC MEASUREMENT SYSTEM;

OPTOELECTRONIC DEVICES;

EID: 0030230659     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.571758     Document Type: Article

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