A novel high-impedence probe for multi-gigahertz signal measurement

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 2, 1996, Pages 575-579

  Shinagawa, Mitsuru ^a,b   Nagatsuma, Tadao ^a,b  

^a IEEE

^b NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; BISMUTH COMPOUNDS; CAPACITANCE; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; ELECTROOPTICAL MATERIALS; INTEGRATED CIRCUITS; LASER PULSES; POLARIZATION; SIGNAL NOISE MEASUREMENT;

ELECTROOPTIC SAMPLING; ELECTROSTATIC DISCHARGE; HAND HELD PROBE; ON BOARD CIRCUITS; ULTRAFAST DEVICES; VOLTAGE SENSITIVITY;

PROBES;

EID: 0030126986     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.492790     Document Type: Article

References (6)

1. J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, "Picosecond electrooptic sampling system," Appl. Phys. Lett., vol. 41, pp. 211-212, 1982.
2. T. Nagatsuma, "Measurement of high-speed devices and integrated circuits using electro-optic sampling technique," IEICE Trans. Electron., vol. E76-C, no. 1, pp. 55-63, 1993.
3. H. K. Heinrich, B. R. Hemenway, K. A. McGroddy, and D. M. Bloom, "Measurement of real time digital signals in a silicon bipolar junction transistor using a noninvasive optical probe,"Electron. Lett., vol. 22, pp. 650-651, 1986.
4. M. Shinagawa and T. Nagatsuma, "An automated electro-optic probing system for ultra-high-speed IC's,"IEEE Trans. Instrum. Meas., vol. 43, no. 6, pp. 843-847, 1994.
5. R. J. Mears, L. Reekie, I. M. Jauncey, and D. N. Payne, "High-gain rare-earth-doped fiber amplifier at 1.54 mm," in Tech. Dig. Series, Sixth Int. Conf. Integrated Optics and Optical Fiber Commun, Washington DC, Optical Society of America, 1987, paper WI2.
6. T. Kawamura, M. Suzuki, and H. Ichino, "An extremely low-power bipolar current-mode I/O circuit for multi-Gbit/s interfaces,"VLSI Circuit Dig. Tech. Paper, pp. 31-32, 1994.