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1
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0030195746
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Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices
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T. Otsuji, T. Nagatsuma, K. Kato, and M. Yoneyama, "Widely tunable electrooptic pulse-pattern generation and its application to on-wafer large-signal characterization of ultra high-speed electronic devices," Opt. Quantum Electron., vol. 28, no. 7, pp. 991-1005, 1996.
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Opt. Quantum Electron.
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Otsuji, T.1
Nagatsuma, T.2
Kato, K.3
Yoneyama, M.4
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2
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0027553265
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100 GHz wafer probes based on photoconductive sampling
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Mar.
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M. D. Feuer, S. C. Shunk, P. R. Smith, M. C. Nuss, and H. H. Law, "100 GHz wafer probes based on photoconductive sampling," IEEE Photon. Technol. Lett., vol. 5, pp. 361-364, Mar. 1993.
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Feuer, M.D.1
Shunk, S.C.2
Smith, P.R.3
Nuss, M.C.4
Law, H.H.5
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3
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0344920269
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Picosecond detector, optical temporal analyzer, and free-standing circuit probe
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J. Nees and S. Williamson, "Picosecond detector, optical temporal analyzer, and free-standing circuit probe," in Proc. Ultrafast Electronics and Optoelectronics, 1993, pp. 24-26.
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(1993)
Proc. Ultrafast Electronics and Optoelectronics
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Nees, J.1
Williamson, S.2
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4
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0029231305
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High-frequency on-wafer testing with freely positionable silicon-on-sapphire photoconductive probes
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T. Pfeifer, H.-M. Heiliger, E. S. Kamienski, H. G. Roskos, and H. Kurz, "High-frequency on-wafer testing with freely positionable silicon-on-sapphire photoconductive probes," in Dig. IEEE MTT-S Int. Microwave Symp., 1995, pp. 1053-1056.
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(1995)
Dig. IEEE MTT-S Int. Microwave Symp.
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Pfeifer, T.1
Heiliger, H.-M.2
Kamienski, E.S.3
Roskos, H.G.4
Kurz, H.5
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5
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0027559006
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Characterization of resistive transmission lines to 70 GHz with ultrafast optoelectronics
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Mar.
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A. Deutsch, M. R. Scheuermann, G. Arjavalingam, L. Kneller, J. K. Tam, and C. W. Surovic, "Characterization of resistive transmission lines to 70 GHz with ultrafast optoelectronics," IEEE Microwave Guided Wave Lett., vol. 3, pp. 75-77, Mar. 1993.
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IEEE Microwave Guided Wave Lett.
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Deutsch, A.1
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Arjavalingam, G.3
Kneller, L.4
Tam, J.K.5
Surovic, C.W.6
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6
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0032688819
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Wideband high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal responses of high-speed electronic devices
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May
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T. Otsuji, K. Kato, S. Kimura, and T. Nagatsuma, "Wideband high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal responses of high-speed electronic devices," IEEE Trans. Microwave Theory Tech., vol. 47, pp. 525-533, May 1999.
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Otsuji, T.1
Kato, K.2
Kimura, S.3
Nagatsuma, T.4
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7
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0001992782
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Uni-traveling-carrier photodiodes
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T. Ishibashi, N. Shimizu, S. Kodama, H. Ito, T. Nagatsuma, and T. Furuta, "Uni-traveling-carrier photodiodes," in Tech. Dig. Ultrafast Electronics and Optoelectronics, 1997, pp. 166-168.
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(1997)
Tech. Dig. Ultrafast Electronics and Optoelectronics
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Ishibashi, T.1
Shimizu, N.2
Kodama, S.3
Ito, H.4
Nagatsuma, T.5
Furuta, T.6
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8
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0032025527
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InP-InGaAs unitraveling-carrier photodiode with improved 3-dB bandwidth of over 150 GHz
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Mar.
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N. Shimizu, N. Watanabe, T. Furuta, and T. Ishibashi, "InP-InGaAs unitraveling-carrier photodiode with improved 3-dB bandwidth of over 150 GHz," IEEE Photon. Technol. Lett., vol. 10, pp. 412-414, Mar. 1998.
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Shimizu, N.1
Watanabe, N.2
Furuta, T.3
Ishibashi, T.4
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9
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0345351543
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Optoelectronic techniques for characterization of millimeter-wave devices
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T. Nagatsuma, T. Otsuji, N. Shimizu, M. Yaita, K. Kato, and M. Shinagawa, "Optoelectronic techniques for characterization of millimeter-wave devices," in Proc. IEEE MTT-S and LEOS Topical Meet. Optical Microwave Interaction, 1994, pp. 7-10.
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(1994)
Proc. IEEE MTT-S and LEOS Topical Meet. Optical Microwave Interaction
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Nagatsuma, T.1
Otsuji, T.2
Shimizu, N.3
Yaita, M.4
Kato, K.5
Shinagawa, M.6
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10
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0344920265
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Characterization of >300 GHz transistors using a novel optoelectronic network analyzer
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Garmisch-Partenkirchen, Germany
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N. Sahri, T. Nagatsuma, T. Otsuji, N. Shimizu, and M. Yaita, "Characterization of >300 GHz transistors using a novel optoelectronic network analyzer," in Proc. 1998 Int. Conf. Ultrafast Phenomena, Garmisch-Partenkirchen, Germany, 1998, pp. 282-283.
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(1998)
Proc. 1998 Int. Conf. Ultrafast Phenomena
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Sahri, N.1
Nagatsuma, T.2
Otsuji, T.3
Shimizu, N.4
Yaita, M.5
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