Wide-band high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal responses of high-speed electronic devices

IEEE Transactions on Microwave Theory and Techniques

Volumn 47, Issue 5, 1999, Pages 525-533

  Otsuji, Taiichi ^a,b   Kato, Kazutoshi ^c   Kimura, Shunji ^d   Nagatsuma, Tadao ^d  

^a IEEE

^b NTT Network Innovation Laboratories   (Japan)

^c KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^d NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COAXIAL CABLES; HIGH ELECTRON MOBILITY TRANSISTORS; INTEGRATED CIRCUIT TESTING; INTEGRATED OPTOELECTRONICS; PHOTODIODES; WAVEGUIDES;

ELECTRICAL SIGNAL TRANSMISSION; LARGE SIGNAL RESPONSES; MODAL DISPERSION; OPTICAL TO ELECTRICAL CONVERSION;

PROBES;

EID: 0032688819     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.763150     Document Type: Article

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