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Volumn 48, Issue 3, 2001, Pages 573-580
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Effects of annealing on Ti, Pd, and Ni/n-Al0.11Ga0.89N Schottky diodes
a a a a a |
Author keywords
AFM; AlGaN; Annealing; Schottky diode
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
AUGER ELECTRON SPECTROSCOPY;
ELECTRIC CURRENT MEASUREMENT;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SURFACE ROUGHNESS;
CAPACITANCE-VOLTAGE MEASUREMENTS;
CURRENT-VOLTAGE MEASUREMENTS;
SCHOTTKY BARRIER DIODES;
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EID: 0035278833
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.906453 Document Type: Article |
Times cited : (79)
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References (20)
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