-
1
-
-
0343042863
-
Point strain sources compensating misfit during epitaxial growth
-
Albrecht, M., S. Christiansen and H.P. Strunk. Point strain sources compensating misfit during epitaxial growth. Appl. Phys. Lett. 70(8) 952-954, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.70
, Issue.8
, pp. 952-954
-
-
Albrecht, M.1
Christiansen, S.2
Strunk, H.P.3
-
3
-
-
0023040588
-
Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer
-
Amano, H., N. Sawaki, I. Akasaki and Y. Toyoda. Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer. Appl. Phys. Lett. 48 353-355, 1986.
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 353-355
-
-
Amano, H.1
Sawaki, N.2
Akasaki, I.3
Toyoda, Y.4
-
4
-
-
0001208092
-
-
Amano, H., M. Iwaya, N. Hayashi, T. Kashima, M. Katsuragawa, T. Takeuchi, C. Wetzel and I. Akasaki. MRS Internet J. Nitride Semicond. Res. 4S1 G10.1, 1999.
-
(1999)
MRS Internet J. Nitride Semicond. Res.
, vol.4 S1
-
-
Amano, H.1
Iwaya, M.2
Hayashi, N.3
Kashima, T.4
Katsuragawa, M.5
Takeuchi, T.6
Wetzel, C.7
Akasaki, I.8
-
6
-
-
0000408467
-
High quality epitaxial GaAs and InP wafers by isoelectronic doping
-
Beneking, H., P. Narozny and N. Emeis. High quality epitaxial GaAs and InP wafers by isoelectronic doping. Appl. Phys. Lett. 47 828-830, 1985.
-
(1985)
Appl. Phys. Lett.
, vol.47
, pp. 828-830
-
-
Beneking, H.1
Narozny, P.2
Emeis, N.3
-
8
-
-
0000382944
-
Nitridation of sapphire. Effect on the optical properties of GaN epitaxial overlayers
-
Grandjean, N., J. Massies and M. Lerous. Nitridation of sapphire. Effect on the optical properties of GaN epitaxial overlayers. Applied Physics Letters 69(14) 2071, 1996.
-
(1996)
Applied Physics Letters
, vol.69
, Issue.14
, pp. 2071
-
-
Grandjean, N.1
Massies, J.2
Lerous, M.3
-
9
-
-
0031188496
-
-
Heinlein, C., J.K. Grepstad, T. Berge and H. Riechert. Appl. Phys. Lett. 71 341, 1997.
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 341
-
-
Heinlein, C.1
Grepstad, J.K.2
Berge, T.3
Riechert, H.4
-
10
-
-
4043076253
-
Pinholes, Dislocations and Strain Relaxation in InGaN
-
Jahnen, B., M. Albrecht, W. Dorsch, S. Christiansen, H.P. Strunk, D. Hanser and Robert F. Davis, Pinholes, Dislocations and Strain Relaxation in InGaN. MRS Internet J. Nitride Semicond. Res. 3 39, 1998.
-
(1998)
MRS Internet J. Nitride Semicond. Res.
, vol.3
, pp. 39
-
-
Jahnen, B.1
Albrecht, M.2
Dorsch, W.3
Christiansen, S.4
Strunk, H.P.5
Hanser, D.6
Davis, R.F.7
-
11
-
-
3442894526
-
GaN Homoepitaxy for Device Applications
-
Kamp M., C. Kirchner, V. Schwegler, A. Pelzmann, K.J. Ebeling, M. Leszczynski, I. Grzegory, T. Suski and S. Porowski. GaN Homoepitaxy for Device Applications. MRS Internet J. Nitride Semicond. Res. 4S1 G10.2, 1999.
-
(1999)
MRS Internet J. Nitride Semicond. Res.
, vol.4 S1
-
-
Kamp, M.1
Kirchner, C.2
Schwegler, V.3
Pelzmann, A.4
Ebeling, K.J.5
Leszczynski, M.6
Grzegory, I.7
Suski, T.8
Porowski, S.9
-
12
-
-
0000223380
-
Optical patterning of GaN films
-
Kelly, M.K., O. Ambacher, B. Dahlheimer, G. Groos, R. Dimitrov, H. Angerer and M. Stutzmann. Optical patterning of GaN films. Appl. Phys. Lett. 69(12) 1749-1751, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, Issue.12
, pp. 1749-1751
-
-
Kelly, M.K.1
Ambacher, O.2
Dahlheimer, B.3
Groos, G.4
Dimitrov, R.5
Angerer, H.6
Stutzmann, M.7
-
13
-
-
0342840996
-
Thermal stress in GaN epitaxial layers grown on sapphire substrates
-
Kozawa, T., T. Kachi, H. Kano, H. Nagase, N. Koide and K. Manabe. Thermal stress in GaN epitaxial layers grown on sapphire substrates. J. Appl. Phys. 77(9) 4389-4392, 1995.
-
(1995)
J. Appl. Phys.
, vol.77
, Issue.9
, pp. 4389-4392
-
-
Kozawa, T.1
Kachi, T.2
Kano, H.3
Nagase, H.4
Koide, N.5
Manabe, K.6
-
14
-
-
0000100475
-
Electrical characterization of GaN p-n junctions with and without threading dislocations
-
Kozodoy, P., J.P. Ibbetson, H. Marchand, P.T. Fini, S. Keller, J.S. Speck, S.P. DenBaars and U.K. Mishra. Electrical characterization of GaN p-n junctions with and without threading dislocations. Appl. Phys. Lett. 73(7) 975-977, 1998.
-
(1998)
Appl. Phys. Lett.
, vol.73
, Issue.7
, pp. 975-977
-
-
Kozodoy, P.1
Ibbetson, J.P.2
Marchand, H.3
Fini, P.T.4
Keller, S.5
Speck, J.S.6
DenBaars, S.P.7
Mishra, U.K.8
-
16
-
-
0000361513
-
Light scattering in high-dislocation- Density GaN
-
Liau, Z.L., R.L. Aggarwal, P.A. Maki, R.J. Molnar, J.N. Walpole, R.C. Williamson and I. Melngallis. Light scattering in high-dislocation- density GaN. Appl. Phys. Lett. 69(12) 1665-1667, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, Issue.12
, pp. 1665-1667
-
-
Liau, Z.L.1
Aggarwal, R.L.2
Maki, P.A.3
Molnar, R.J.4
Walpole, J.N.5
Williamson, R.C.6
Melngallis, I.7
-
19
-
-
0343478693
-
Role of Molecular Beam Epitaxy in the Field of Optoelectronics
-
Meier, H.P., M. Kamp and S. Strite. Role of Molecular Beam Epitaxy in the Field of Optoelectronics. Microelectronics Journal. 25(8) 609-617, 1994.
-
(1994)
Microelectronics Journal
, vol.25
, Issue.8
, pp. 609-617
-
-
Meier, H.P.1
Kamp, M.2
Strite, S.3
-
20
-
-
0030681096
-
Free and bound exciton in GaN epitaxial films
-
Meyer, B.K. Free and bound exciton in GaN epitaxial films. Mat. Res. Soc. Symp. Proc. 449 497-507, 1997.
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.449
, pp. 497-507
-
-
Meyer, B.K.1
-
21
-
-
0343367300
-
Characteristics of Room Temperature-CW Operated InGaN Multi-Quantum-Well-Structure Laser Diodes
-
Nakamura, S. Characteristics Of Room Temperature-CW Operated InGaN Multi-Quantum-Well-Structure Laser Diodes. MRS Internet J. Nitride Semicond. Res. 2 5, 1997.
-
(1997)
MRS Internet J. Nitride Semicond. Res.
, vol.2
, pp. 5
-
-
Nakamura, S.1
-
22
-
-
0343478691
-
-
private communication
-
Nakamura, S. private communication.
-
-
-
Nakamura, S.1
-
24
-
-
0344670488
-
-
Nakamura S., M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, Y. Sugimoto, T. Kozaki, H. Umemto, M. Sano and K. Chocho. Appl. Phys. Lett. 73 832, 1998.
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 832
-
-
Nakamura, S.1
Senoh, M.2
Nagahama, S.3
Iwasa, N.4
Yamada, T.5
Matsushita, T.6
Kiyoku, H.7
Sugimoto, Y.8
Kozaki, T.9
Umemto, H.10
Sano, M.11
Chocho, K.12
-
25
-
-
3442897475
-
InGaN/GaN/AlGaN-BASED LEDS and LASER DIODES
-
Nakamura, S., M. Senoh, S. Nagahama, N. Iwasa, T. Matushita and T. Mukai. InGaN/GaN/AlGaN-BASED LEDS and LASER DIODES. MRS Internet J. Nitride Semicond. Res. 4S1 G1.1, 1999.
-
(1999)
MRS Internet J. Nitride Semicond. Res.
, vol.4 S1
-
-
Nakamura, S.1
Senoh, M.2
Nagahama, S.3
Iwasa, N.4
Matushita, T.5
Mukai, T.6
-
26
-
-
0030213960
-
AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress
-
Osinski, M., J. Zeller, P.C. Chiu, B.S. Phillips and D.L. Barton. AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress. Appl. Phys. Lett. 69(7) 898-900, 1996.
-
(1996)
Appl. Phys. Lett.
, vol.69
, Issue.7
, pp. 898-900
-
-
Osinski, M.1
Zeller, J.2
Chiu, P.C.3
Phillips, B.S.4
Barton, D.L.5
-
27
-
-
0042617350
-
-
A.G. Gullis, J.L. Hutchison and A.E. Staton-Bevan eds, IOP Publishing, Bristol
-
Pidduck, A.J., D.J. Robbins and A.G. Gullis. In Microscopy of Semiconducting Materials A.G. Gullis, J.L. Hutchison and A.E. Staton-Bevan eds, IOP Publishing, Bristol 1993.
-
(1993)
Microscopy of Semiconducting Materials
-
-
Pidduck, A.J.1
Robbins, D.J.2
Gullis, A.G.3
-
30
-
-
0001132782
-
Open-core screw dislocations in GaN epilayers observed by scanning force microscopy and high-resolution transmission electron microscopy
-
Qian, W., G.S. Rohrer, M.S. Skowronski, K. Doverspike, L.B. Rowland and D.K. Gaskill. Open-core screw dislocations in GaN epilayers observed by scanning force microscopy and high-resolution transmission electron microscopy. Appl. Phys. Lett. 67(16) 2284-2286, 1995.
-
(1995)
Appl. Phys. Lett.
, vol.67
, Issue.16
, pp. 2284-2286
-
-
Qian, W.1
Rohrer, G.S.2
Skowronski, M.S.3
Doverspike, K.4
Rowland, L.B.5
Gaskill, D.K.6
-
31
-
-
0001299015
-
Dry etching of GaN substrates for high-quality homoepitaxy
-
Schauler, M., F. Eberhard, C. Kirchner, V. Schwegler, A. Pelzmann, M. Kamp, K.J. Ebeling, F. Bertram, T. Riemann, J. Christen, M. Leszczynski, I. Grzegory, T. Suski and S. Porowski. Dry etching of GaN substrates for high-quality homoepitaxy. Appl. Phys. Lett. 74(8) 1123-1125, 1999.
-
(1999)
Appl. Phys. Lett.
, vol.74
, Issue.8
, pp. 1123-1125
-
-
Schauler, M.1
Eberhard, F.2
Kirchner, C.3
Schwegler, V.4
Pelzmann, A.5
Kamp, M.6
Ebeling, K.J.7
Bertram, F.8
Riemann, T.9
Christen, J.10
Leszczynski, M.11
Grzegory, I.12
Suski, T.13
Porowski, S.14
-
33
-
-
0030692283
-
Plasma cleaning und nitridation of sapphire substrates for AlGaN epitaxy as studied by ARXPS and XPD
-
Seelmann-Eggebert, M., H. Zimmermann, H. Obloh, R. Niebuhr and B. Wachtendorf. Plasma cleaning und nitridation of sapphire substrates for AlGaN epitaxy as studied by ARXPS and XPD. Mat. Res. Soc. Symp. Proc. 468 193, 1997.
-
(1997)
Mat. Res. Soc. Symp. Proc.
, vol.468
, pp. 193
-
-
Seelmann-Eggebert, M.1
Zimmermann, H.2
Obloh, H.3
Niebuhr, R.4
Wachtendorf, B.5
-
34
-
-
0001619444
-
Vertical strain and doping gradients in thick GaN layers
-
Siegle, H., A. Hoffmann, L. Eckey, C. Thomsen, J. Christen, F. Bertram, D. Schmidt, D. Rudloff and K. Hirmatsu. Vertical strain and doping gradients in thick GaN layers. Appl. Phys. Lett. 71(17) 2490-2492, 1999.
-
(1999)
Appl. Phys. Lett.
, vol.71
, Issue.17
, pp. 2490-2492
-
-
Siegle, H.1
Hoffmann, A.2
Eckey, L.3
Thomsen, C.4
Christen, J.5
Bertram, F.6
Schmidt, D.7
Rudloff, D.8
Hirmatsu, K.9
-
35
-
-
0003610689
-
Dislocation motion in GaN light-emitting devices and its effect on device lifetime
-
Sugiura, L. Dislocation motion in GaN light-emitting devices and its effect on device lifetime. J. Appl. Phys. 81(4) 1633-1638, 1997.
-
(1997)
J. Appl. Phys.
, vol.81
, Issue.4
, pp. 1633-1638
-
-
Sugiura, L.1
-
36
-
-
0000326438
-
Nitridataion process of sapphire substrate surface and its effect on the growth of GaN
-
Uchida, K., A. Watanabe, F. Yano, M. Kouguchi, T. Tanaka and S. Minagawa. Nitridataion process of sapphire substrate surface and its effect on the growth of GaN. J. Appl. Phys. 79 7, 1996.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 7
-
-
Uchida, K.1
Watanabe, A.2
Yano, F.3
Kouguchi, M.4
Tanaka, T.5
Minagawa, S.6
-
40
-
-
0032048780
-
Scattering of electrons at threading dislocations in GaN
-
Weimann, N., L.F. Eastman, D. Doppalapudi, H.M. Ng and T.D. Moustakes. Scattering of electrons at threading dislocations in GaN. Appl. Phys. Lett. 83(7) 3656-3658, 1998.
-
(1998)
Appl. Phys. Lett.
, vol.83
, Issue.7
, pp. 3656-3658
-
-
Weimann, N.1
Eastman, L.F.2
Doppalapudi, D.3
Ng, H.M.4
Moustakes, T.D.5
-
41
-
-
0032094525
-
Dislocation generation in GaN heteroepitaxy
-
Wu, X.H., P. Fini, E.J. Tarsa, B. Heying, S. Keller, U.K. Mishra, S.P. DenBaars and J.S. Speck. Dislocation generation in GaN heteroepitaxy. Journal of Crystal Growth 189/190 231-243, 1998.
-
(1998)
Journal of Crystal Growth
, vol.189-190
, pp. 231-243
-
-
Wu, X.H.1
Fini, P.2
Tarsa, E.J.3
Heying, B.4
Keller, S.5
Mishra, U.K.6
DenBaars, S.P.7
Speck, J.S.8
-
42
-
-
4043083399
-
-
Zywietz, T., J. Neugebauer, M. Scheffler, J. Northrup and Chris G. Van de Walle. MRS Internet J. Nitride Semicond. Res. 3 26, 1998.
-
(1998)
MRS Internet J. Nitride Semicond. Res.
, vol.3
, pp. 26
-
-
Zywietz, T.1
Neugebauer, J.2
Scheffler, M.3
Northrup, J.4
Van De Walle, C.G.5
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