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Volumn 3, Issue , 1998, Pages

Pinholes, dislocations and strain relaxation in InGaN

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; ATOMIC FORCE MICROSCOPY; HETEROJUNCTIONS; LATTICE CONSTANTS; OPTOELECTRONIC DEVICES; STRAIN CONTROL; STRESS CONCENTRATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 4043076253     PISSN: 10925783     EISSN: None     Source Type: Journal    
DOI: 10.1557/S1092578300001113     Document Type: Article
Times cited : (26)

References (12)
  • 8
    • 0016650833 scopus 로고    scopus 로고
    • J.W. Matthews, in, Edited by:, J.W. Matthews, (Academic Press, New York, 1975) 559-609
    • J.W. Matthews, in, Edited by:, J.W. Matthews, (Academic Press, New York, 1975) 559-609.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.