Design and application of scanning near-field optical/atomic force microscopy

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 154-160

  Ataka, Tatsuaki ^a   Muramatsu, Hiroshi ^a   Nakajima, Kunio ^a   Chiba, Norio ^a   Homma, Katsunori ^a   Fujihara, Masamichi ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Nanostructures; Optical properties; Surface roughness

Indexed keywords

FLUORESCENCE; LIGHT TRANSMISSION; MICROSCOPES; NANOSTRUCTURED MATERIALS; OPTICAL FIBERS; OPTICAL PROPERTIES; REFLECTION; SURFACE ROUGHNESS;

ATOMIC FORCE MICROSCOPE PROBE; LIQUID MODES; NEAR FIELD OPTICAL PROBE; SCANNING NEAR FIELD OPTICAL ATOMIC FORCE MICROSCOPY; VERTICAL VIBRATING MODE;

ATOMIC FORCE MICROSCOPY;

EID: 0030079179     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06809-0     Document Type: Article

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