Near-field scanning solid immersion microscope

Applied Physics Letters

Volumn 72, Issue 22, 1998, Pages 2779-2781

  Ghislain, L P ^a   Elings, V B ^a  

^a Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000832375     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121457     Document Type: Article

References (10)

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