Tuning fork shear-force feedback

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 149-157

  Ruiter, A G T ^a   Van Der Werf, K O ^a   Veerman, J A ^a   Garcia Parajo, M F ^a   Rensen, W H J ^a   Van Hulst, N F ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DNA; FEEDBACK; MECHANICAL VARIABLES CONTROL; OPTICAL FIBERS; OSCILLATIONS; SURFACES;

DISTANCE CONTROL MECHANISM; FIRST ORDER PARAMETER; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SECOND ORDER PARAMETER; TUNING FORK SHEAR FORCE FEEDBACK;

OPTICAL MICROSCOPY;

ARTICLE; CALCULATION; CALIBRATION; FEEDBACK SYSTEM; FORCE; OSCILLATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIMULATION;

ALUMINUM SILICATES; DNA; FIBER OPTICS; MICROSCOPY; MICROSCOPY, ELECTRON, SCANNING; VIBRATION;

EID: 0032033545     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00111-3     Document Type: Article

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