Single event upsets in implantable cardioverter defibrillators

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2929-2940

  Bradley, P D ^a   Normand, E ^b  

^a UNIVERSITY OF WOLLONGONG   (Australia)

^b BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BURST GENERATION RATE; IMPLANTABLE CARDIOVERTER DEFIBRILLATORS; SINGLE EVENT UPSETS (SEU);

COSMIC RAYS; HEAVY IONS; IMPLANTS (SURGICAL); RADIATION EFFECTS;

DEFIBRILLATORS;

EID: 0032319596     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736549     Document Type: Article

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